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Bruker Metrology Workshops
Workshop “TERS and co-localised AFM Raman”
*** NEW DATE : 21st January 2015 ****
Renishaw - Wotton under Edge (near Bristol), UK
Recent advances in the integration of AFM nanoscale analysis and Raman chemical fingerprinting now make this combined technique accessible to researchers in all scientific disciplines. The workshop will highlight applications and technology development as well as provide the opportunity to network with researchers in this field.
Invited speakers will discuss cutting edge applications including graphene, biological/pharmaceutical applications and device characterisation. Practical workshops will highlight new instrumental innovations and experimental best practice.
"AFM and Raman Characterisation of Graphene and 2D materials"
"Integrated AFM Raman and Nanomechanical Mapping on Novel Materials”
"AFM Raman studies of biomedical coatings"
"Advances in integration of AFM and Raman"
The workshop runs from 09.30 to 16.00 at Renishaw’s UK headquarters in Wotton under Edge, Gloucestershire, close to Bristol. There is no cost for this event but space is limited.
For further information, please do not hesitate to contact us. We hope to see you at this exciting event!
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